Spatially Modulated Illumination Microscopy
نویسندگان
چکیده
Using Spectral Precision Distance Microscopy (SPDM) it is possible to measure positions and multiple distances between point-like fluorescent objects labelled with different spectral signatures far below the optical resolution criterion. In this paper, we report measurements and data acquisition using a Spatially Modulated Illumination (SMI) microscope. Furthermore, we studied some aspects of the theoretical limits of SPDM using virtual microscopy.
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